ABOUT

STEERING COMMITTEE
    CHAIRS
  • International : Seung-Seok Lee (KRISS, KR)
  • Domestic : Kyookun Koh (ANSCO, KR)
                        Taesoon Sohn (KANDT, KR)
    MEMBERS
  • • Cesar Belinco (CNEA, AR)
  • • Leonard J. Bond (Iowa State University, US)
  • • Patrick Brisset (IAEA, AT)
  • • Pierre Calmon (LIST CEA, FR)
  • • Scott Cargill (MISTRAS, US)
  • • Peter Cawley (Imperial College London, GB)
  • • Fu-Kuo Chang (Stanford University, US)
  • • Chih-Hung Chiang (CYUT, TW)
  • • Manyong Choi (KRISS, KR)
  • • Yuris A. Dzenis (UNL, US)
  • • Arthur Every (University of the Witwatersrand, ZA)
  • • Uwe Ewert (BAM, DE)
  • • Fermin Gomez Fraile (EFNDT, ES)
  • • Chengbin Guo (CAS, CN)
  • • Soichi Hirose (Tokyo Institute of Technology, JP)
  • • Nam Ho (WCI, KR)
  • • Ikuo Ihara (Nagaoka University of Technology, JP)
  • • Harold Jansen (SAIW, Z A)
  • • Kyungcho Kim (KINS, KR)
     
  • • Teruo Kishi (University of Tokyo, JP)
  • • Vjera Krstelj (University of Zagreb, HR)
  • • Tribikram Kundu (University of Arizona, US)
  • • Jong Po Lee (ANSCO, KR)
  • • Joon Hyun Lee (Pusan National University, KR)
  • • Xavier Maldague (Université Laval, CA)
  • • Alexander Mullin (RTC Testing and Diagnostics, RU)
  • • Takamasa Ogata (JSNDI, JP)
  • • Morio Onoe (University of Tokyo, JP)
  • • Norikazu Ooka (JSNDI, JP)
  • • Joseph L. Rose (Pennsylvania State University, US)
  • • Kamal Sahaimi (Qualite Controle Mesure, MA)
  • • Takahide Sakagami (Kobe University, JP)
  • • Gongtian Shen (ChSNDT, CN)
  • • Peter Trampus (University of Dunaujvaros, HU)
  • • Michael Turnbow (ASME, US)
  • • B. Venkatraman (IGCAR, IN)
  • • Tsung Tsong Wu (National Taiwan University, TW)
  • • Chunguang Xu (BIT, CN)