ABOUT
- STEERING COMMITTEE
CHAIRS
- International : Seung-Seok Lee (KRISS, KR)
-
Domestic : Kyookun Koh (ANSCO, KR)
Taesoon Sohn (KANDT, KR)
MEMBERS
- • Cesar Belinco (CNEA, AR)
- • Leonard J. Bond (Iowa State University, US)
- • Patrick Brisset (IAEA, AT)
- • Pierre Calmon (LIST CEA, FR)
- • Scott Cargill (MISTRAS, US)
- • Peter Cawley (Imperial College London, GB)
- • Fu-Kuo Chang (Stanford University, US)
- • Chih-Hung Chiang (CYUT, TW)
- • Manyong Choi (KRISS, KR)
- • Yuris A. Dzenis (UNL, US)
- • Arthur Every (University of the Witwatersrand, ZA)
- • Uwe Ewert (BAM, DE)
- • Fermin Gomez Fraile (EFNDT, ES)
- • Chengbin Guo (CAS, CN)
- • Soichi Hirose (Tokyo Institute of Technology, JP)
- • Nam Ho (WCI, KR)
- • Ikuo Ihara (Nagaoka University of Technology, JP)
- • Harold Jansen (SAIW, Z A)
- • Kyungcho Kim (KINS, KR)
- • Teruo Kishi (University of Tokyo, JP)
- • Vjera Krstelj (University of Zagreb, HR)
- • Tribikram Kundu (University of Arizona, US)
- • Jong Po Lee (ANSCO, KR)
- • Joon Hyun Lee (Pusan National University, KR)
- • Xavier Maldague (Université Laval, CA)
- • Alexander Mullin (RTC Testing and Diagnostics, RU)
- • Takamasa Ogata (JSNDI, JP)
- • Morio Onoe (University of Tokyo, JP)
- • Norikazu Ooka (JSNDI, JP)
- • Joseph L. Rose (Pennsylvania State University, US)
- • Kamal Sahaimi (Qualite Controle Mesure, MA)
- • Takahide Sakagami (Kobe University, JP)
- • Gongtian Shen (ChSNDT, CN)
- • Peter Trampus (University of Dunaujvaros, HU)
- • Michael Turnbow (ASME, US)
- • B. Venkatraman (IGCAR, IN)
- • Tsung Tsong Wu (National Taiwan University, TW)
- • Chunguang Xu (BIT, CN)